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DCフィールド | 値 | 言語 |
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dc.contributor.author | Yoshida, Hiroyuki | en |
dc.contributor.alternative | 吉田, 弘幸 | ja |
dc.date.accessioned | 2015-07-02T05:16:42Z | - |
dc.date.available | 2015-07-02T05:16:42Z | - |
dc.date.issued | 2014-02-28 | - |
dc.identifier.issn | 1618-2642 | - |
dc.identifier.uri | http://hdl.handle.net/2433/198619 | - |
dc.description.abstract | Electron affinity is a fundamental energy parameter of materials. In organic semiconductors, the electron affinity is closely related to electron conduction. It is not only important to understand fundamental electronic processes in organic solids, but it is also indispensable for research and development of organic semiconductor devices such as organic light-emitting diodes and organic photovoltaic cells. However, there has been no experimental technique for examining the electron affinity of organic materials that meets the requirements of such research. Recently, a new method, called low-energy inverse-photoemission spectroscopy, has been developed. A beam of low-energy electrons is focused onto the sample surface, and photons emitted owing to the radiative transition to unoccupied states are then detected. From the onset of the spectral intensity, the electron affinity is determined within an uncertainty of 0.1 eV. Unlike in conventional inverse-photoemission spectroscopy, sample damage is negligible and the resolution is improved by a factor of 2. The principle of the method and several applications are reported. | en |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | Springer Berlin Heidelberg | en |
dc.rights | The final publication is available at Springer via http://dx.doi.org/10.1007/s00216-014-7659-1. | en |
dc.rights | This is not the published version. Please cite only the published version. | en |
dc.rights | この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。 | ja |
dc.subject | Electron affinity | en |
dc.subject | Ionization energy | en |
dc.subject | Organic semiconductor | en |
dc.subject | Low-energy inverse-photoemission | en |
dc.subject | spectroscopy | en |
dc.subject | Unoccupied states | en |
dc.subject | Energy gap | en |
dc.title | Measuring the electron affinity of organic solids: an indispensable new tool for organic electronics. | en |
dc.type | journal article | - |
dc.type.niitype | Journal Article | - |
dc.identifier.jtitle | Analytical and bioanalytical chemistry | en |
dc.identifier.volume | 406 | - |
dc.identifier.issue | 9-10 | - |
dc.identifier.spage | 2231 | - |
dc.identifier.epage | 2237 | - |
dc.relation.doi | 10.1007/s00216-014-7659-1 | - |
dc.textversion | author | - |
dc.startdate.bitstreamsavailable | 2015-02-28 | - |
dc.identifier.pmid | 24577573 | - |
dcterms.accessRights | open access | - |
出現コレクション: | 学術雑誌掲載論文等 |
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