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書誌情報 | ファイル |
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Characterization of nanotextured AIN thin films by x-ray absorption near-edge structures Suga, T; Kameyama, S; Yoshioka, S; Yamamoto, T; Tanaka, I; Mizoguchi, T (2005-04-18) APPLIED PHYSICS LETTERS, 86(16) | |
Characterization of nanotextured AIN thin films by x-ray absorption near-edge structures Suga, T; Kameyama, S; Yoshioka, S; Yamamoto, T; Tanaka, I; Mizoguchi, T (2005) APPLIED PHYSICS LETTERS, 86(16) | |
Distribution of solute atoms in beta- and spinel Si(6-)zAl(z)O(z)N(8-z) by AlK-edge x-ray absorption near-edge structure Tatsumi, K; Mizoguchi, T; Yoshioka, S; Yamamoto, T; Suga, T; Sekine, T; Tanaka, I (2005) PHYSICAL REVIEW B, 71(3) | |
Distribution of solute atoms in beta- and spinel Si(6-)zAl(z)O(z)N(8-z) by AlK-edge x-ray absorption near-edge structure Tatsumi, K; Mizoguchi, T; Yoshioka, S; Yamamoto, T; Suga, T; Sekine, T; Tanaka, I (2005-01) PHYSICAL REVIEW B, 71(3) |
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