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書誌情報ファイル
Characterization of nanotextured AIN thin films by x-ray absorption near-edge structures
  Suga, T; Kameyama, S; Yoshioka, S; Yamamoto, T; Tanaka, I; Mizoguchi, T (2005-04-18)
  APPLIED PHYSICS LETTERS, 86(16)
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Characterization of nanotextured AIN thin films by x-ray absorption near-edge structures
  Suga, T; Kameyama, S; Yoshioka, S; Yamamoto, T; Tanaka, I; Mizoguchi, T (2005)
  APPLIED PHYSICS LETTERS, 86(16)
Distribution of solute atoms in beta- and spinel Si(6-)zAl(z)O(z)N(8-z) by AlK-edge x-ray absorption near-edge structure
  Tatsumi, K; Mizoguchi, T; Yoshioka, S; Yamamoto, T; Suga, T; Sekine, T; Tanaka, I (2005)
  PHYSICAL REVIEW B, 71(3)
Distribution of solute atoms in beta- and spinel Si(6-)zAl(z)O(z)N(8-z) by AlK-edge x-ray absorption near-edge structure
  Tatsumi, K; Mizoguchi, T; Yoshioka, S; Yamamoto, T; Suga, T; Sekine, T; Tanaka, I (2005-01)
  PHYSICAL REVIEW B, 71(3)
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