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タイトル: | Effects of Counteranions and Dissolved Oxygen on Chemical ZnO Deposition from Aqueous Solutions |
著者: | Shinagawa, Tsutomu Murase, Kuniaki https://orcid.org/0000-0002-7564-9416 (unconfirmed) Otomo, Satomi Katayama, Jun-ichi Izaki, Masanobu |
キーワード: | electrical conductivity field emission electron microscopy Hall effect II-VI semiconductors liquid phase deposition nucleation pH scanning electron microscopy semiconductor growth semiconductor thin films surface morphology ultraviolet spectra visible spectra wide band gap semiconductors X-ray diffraction zinc compounds |
発行日: | 2009 |
出版者: | Electrochemical Society |
誌名: | JOURNAL OF THE ELECTROCHEMICAL SOCIETY |
巻: | 156 |
号: | 5 |
開始ページ: | H320 |
終了ページ: | H326 |
抄録: | In the chemical ZnO deposition on Pd-catalyzed glass from aqueous dimethylamineborane (DMAB) solutions, effects of counteranions (NO<sub>3</sub><sup>-</sup>, Cl−, ClO<sub>4</sub><sup>-</sup>, and SO<sub>4</sub><sup>2-</sup>) and dissolved oxygen (DO) on the hydrolysis behavior of Zn2+ and the growth regime of ZnO were studied using sodium and zinc salt solutions bubbled with O2, air, or Ar gas. The interaction of the counteranions with H+ and Pd as well as Zn2+ was suggested as an important factor for the chemical ZnO deposition, and it was found that only NO<sub>3</sub><sup>-</sup> can raise the pH of a DMAB solution without DO, affording the continuous ZnO growth. Dissolved oxygen accelerated the ZnO nucleation process on the Pd and had less influence comparable to NO<sub>3</sub><sup>-</sup> on the subsequent growth on the ZnO surface. The ZnO films deposited from Zn(NO3)2–DMAB solutions bubbled with O2, air, or Ar gas were characterized with an X-ray diffractometer, field emission scanning electron microscope, UV-visible spectrophotometer, and Hall coefficient analyzer. The Ar-bubbled solution gave superior ZnO films in terms of crystallinity, growth orientation, surface morphology, and electrical conductivity due to the relatively moderate crystal nucleation compared to in the presence of DO. |
著作権等: | © 2009 The Electrochemical Society |
URI: | http://hdl.handle.net/2433/109930 |
DOI(出版社版): | 10.1149/1.3089353 |
出現コレクション: | 学術雑誌掲載論文等 |
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