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| ファイル | 記述 | サイズ | フォーマット | |
|---|---|---|---|---|
| JJAP.48.08JB15.pdf | 635.78 kB | Adobe PDF | 見る/開く |
| タイトル: | Reversible Potential Change of Ferrocenylthiol Monolayers Induced by Atomic Force Microscopy |
| 著者: | Ichii, Takashi    https://orcid.org/0000-0002-4021-8894 (unconfirmed)Nanjo, Shin-ichiro Murase, Kuniaki https://orcid.org/0000-0002-7564-9416 (unconfirmed)Sugimura, Hiroyuki |
| 著者名の別形: | 一井, 崇 南條, 信一郎 邑瀬, 邦明 杉村, 博之 |
| 発行日: | Aug-2009 |
| 出版者: | Japan Society of Applied Physics |
| 引用: | Takashi Ichii, Shin-ichiro Nanjo, Kuniaki Murase, and Hiroyuki Sugimura. Reversible Potential Change of Ferrocenylthiol Monolayers Induced by Atomic Force Microscopy. Japanese Journal of Applied Physics. 2009, 48(8), 08JB15. |
| 誌名: | Japanese Journal of Applied Physics |
| 巻: | 48 |
| 号: | 8 |
| 論文番号: | 08JB15 |
| 抄録: | Self-assembled monolayers (SAMs) of alkanethiol with a ferrocenyl group (ferrocenylthiol) are well known as electrochemically active ultrathin films. In this study, ferrocenylthiol SAMs were locally modified by applying DC bias voltages to the SAMs using atomic force microscopy (AFM) and the surface potential distributions of the modified areas were investigated by Kelvin probe force microscopy. A positive surface potential shift was detected in the negatively biased regions. In addition, a reversible surface potential change was successfully detected. The surface potential changes were discussed in terms of the electrochemical activity of the ferrocenyl groups. |
| 著作権等: | Copyright © 2009 The Japan Society of Applied Physics This is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。 |
| URI: | http://hdl.handle.net/2433/123518 |
| DOI(出版社版): | 10.1143/JJAP.48.08JB15 |
| 関連リンク: | http://jjap.ipap.jp/link?JJAP/48/08JB15/ |
| 出現コレクション: | 学術雑誌掲載論文等 |
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