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タイトル: | Surface potential measurement of organic thin film on metal electrodes by dynamic force microscopy using a piezoelectric cantilever |
著者: | Satoh, Nobuo Katori, Shigetaka Kobayashi, Kei https://orcid.org/0000-0002-1409-6539 (unconfirmed) Watanabe, Shunji Fujii, Toru Matsushige, Kazumi Yamada, Hirofumi |
著者名の別形: | 佐藤, 宣夫 |
キーワード: | cantilevers electrodes lead compounds organic compounds piezoelectric thin films surface potential surface structure vacuum deposition |
発行日: | 2011 |
出版者: | American Institute of Physics |
誌名: | Journal of Applied Physics |
巻: | 109 |
号: | 11 |
論文番号: | 114306 |
抄録: | We describe applications of a cantilever with a lead zirconate titanate (PZT) piezoelectric film as self-sensing to dynamic force microscopy (DFM) combined with Kelvin probe force microscopy (KFM). We adopted a frequency modulation (FM) detection method not only to stabilize the imaging conditions in our DFM but also to enhance the sensitivity for the detection of electrostatic forces in KFM measurement. We deposited Alq3 [tris (8-hydroxyquinolinato) aluminum] thin films and aluminum (Al) electrode patterns on an indium tin oxide (ITO)/glass substrate by vacuum evaporation using shadow masks. The surface structures and local surface potential of Alq3 films on metals were investigated using our DFM/KFM instrument to study the local electrical properties at the molecule–metal interface. The photosensitive organic material sample can be in a completely dark environment because no optics are required for cantilever deflection sensing in our experimental setup. |
著作権等: | © 2011 American Institute of Physics |
URI: | http://hdl.handle.net/2433/143576 |
DOI(出版社版): | 10.1063/1.3585865 |
出現コレクション: | 学術雑誌掲載論文等 |
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