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dc.contributor.authorHosokawa, Yoshihiroen
dc.contributor.authorKobayashi, Keien
dc.contributor.authorOyabu, Noriakien
dc.contributor.authorMatsushige, Kazumien
dc.contributor.authorYamada, Hirofumien
dc.date.accessioned2011-10-05T04:35:12Z-
dc.date.available2011-10-05T04:35:12Z-
dc.date.issued2010-09-
dc.identifier.issn0034-6748-
dc.identifier.urihttp://hdl.handle.net/2433/147206-
dc.description.abstractWe propose a general procedure to determine the optimum imaging parameters (spring constant and oscillation amplitude) to obtain the optimum resolution in frequency modulation atomic force microscopy. We calculated the effective signal-to-noise ratio for various spring constants and oscillation amplitudes, based on the measurement of frequency shift and energy dissipation versus tip-sample distance curves, to find the optimum. We applied this procedure for imaging a lead phthalocyanine (PbPc) thin film on a MoS2(0001) substrate, and found that the optimum parameters were about 5 N/m and 20 nm, respectively. An improved signal-to-noise ratio was attained in a preliminary experiment using parameters which were close to the calculated optimum.en
dc.format.mimetypeapplication/pdf-
dc.language.isoeng-
dc.publisherAMER INST PHYSICSen
dc.rightsCopyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in REVIEW OF SCIENTIFIC INSTRUMENTS 81, 093701 (2010) and may be found at https://doi.org/10.1063/1.3477995.en
dc.subjectatomic force microscopyen
dc.subjectfrequency modulationen
dc.subjectorganic semiconductorsen
dc.subjectoscillationsen
dc.subjectsemiconductor thin filmsen
dc.titleA procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopyen
dc.typejournal article-
dc.type.niitypeJournal Article-
dc.identifier.ncidAA00817730-
dc.identifier.jtitleREVIEW OF SCIENTIFIC INSTRUMENTSen
dc.identifier.volume81-
dc.identifier.issue9-
dc.relation.doi10.1063/1.3477995-
dc.textversionpublisher-
dc.identifier.artnum093701-
dc.identifier.pmid20886981-
dc.relation.urlhttp://link.aip.org/link/RSINAK/v81/i9/p093701/s1-
dcterms.accessRightsopen access-
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