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dc.contributor.author | Ichii, Takashi | en |
dc.contributor.author | Fukuma, Takeshi | en |
dc.contributor.author | Yoda, Tadashi | en |
dc.contributor.author | Kobayashi, Kei | en |
dc.contributor.author | Matsushige, Kazumi | en |
dc.contributor.author | Yamada, Hirofumi | en |
dc.date.accessioned | 2011-10-05T04:35:16Z | - |
dc.date.available | 2011-10-05T04:35:16Z | - |
dc.date.issued | 2010-01-15 | - |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.uri | http://hdl.handle.net/2433/147209 | - |
dc.description.abstract | Copper-phthalocyanine (CuPc) monolayers and cobalt-phthalocyanine monolayers deposited on Au(111) surfaces were investigated by frequency modulation atomic force microscopy (FM-AFM). Submolecular-resolution topographic images were successfully obtained for both samples. Despite the similar molecular geometry of the two molecules, they showed clearly different contrasts in the topographic images. The origin of the contrast is discussed in terms of the relationship of the molecular orbitals and the chemical interaction between the tip and the molecules. In addition, a molecular-resolution surface potential (SP) image was obtained on CuPc monolayers using Kelvin probe force microscopy (KFM) utilizing FM-AFM. The molecular-scale SP contrast was explained by the electric dipole moment at the organic/metal interface. This result suggested the possibility of the detection of the single molecular dipole moment by KFM. | en |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | American Institute of Physics (AIP) | en |
dc.rights | Copyright 2010 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in JOURNAL OF APPLIED PHYSICS107, 024315 (2010) and may be found at | en |
dc.subject | atomic force microscopy | en |
dc.subject | electric moments | en |
dc.subject | monolayers | en |
dc.subject | organic compounds | en |
dc.title | Submolecular-scale Investigations on metal-phthalocyanine monolayers by frequency modulation atomic force microscopy | en |
dc.type | journal article | - |
dc.type.niitype | Journal Article | - |
dc.identifier.ncid | AA00693547 | - |
dc.identifier.jtitle | Journal of Applied Physics | en |
dc.identifier.volume | 107 | - |
dc.identifier.issue | 2 | - |
dc.relation.doi | 10.1063/1.3284094 | - |
dc.textversion | publisher | - |
dc.identifier.artnum | 024315 | - |
dc.relation.url | http://link.aip.org/link/JAPIAU/v107/i2/p024315/s1 | - |
dcterms.accessRights | open access | - |
出現コレクション: | 学術雑誌掲載論文等 |
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