Applicability of Weibull Distribution to Description of Distributed Normalized Critical Current of Bent-Damaged Bi2223 Composite Tape

Abstract

Critical current of bent-damaged Bi2223 composite tape differs from specimen to specimen. To describe the distributed critical current values of specimens, the three-parameter Weibull distribution function has been employed and has been demonstrated to describe the experimental results. In the present work, the reason for this was discussed by modeling analysis of the experimental results in a round robin test of VAMAS/TWA16. The distribution of the measured normalized critical current values was described well by using the damage evolution approach, in which the difference in damage evolution among the specimens was correlated to the distribution of critical current values. From this approach, the three-parameter Weibull distribution function for critical current values was derived, which gave almost the same parameter values for the minimum critical current, scale parameter and shape parameter as those obtained by the direct application of the Weibull distribution function to the experimental results. Based on this result, the reason why the normalized critical current values of bent-damaged composite tape is described by the three-parameter Weibull distribution function was accounted for in a quantitative manner by the difference in damage evolution among the specimens.