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j.jpowsour.2011.08.097.pdf | 682.36 kB | Adobe PDF | 見る/開く |
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DCフィールド | 値 | 言語 |
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dc.contributor.author | Takanashi, Yu | en |
dc.contributor.author | Orikasa, Yuki | en |
dc.contributor.author | Mogi, Masato | en |
dc.contributor.author | Oishi, Masatsugu | en |
dc.contributor.author | Murayama, Haruno | en |
dc.contributor.author | Sato, Kenji | en |
dc.contributor.author | Yamashige, Hisao | en |
dc.contributor.author | Takamatsu, Daiko | en |
dc.contributor.author | Fujimoto, Takahiro | en |
dc.contributor.author | Tanida, Hajime | en |
dc.contributor.author | Arai, Hajime | en |
dc.contributor.author | Ohta, Toshiaki | en |
dc.contributor.author | Matsubara, Eiichiro | en |
dc.contributor.author | Uchimoto, Yoshiharu | en |
dc.contributor.author | Ogumi, Zempachi | en |
dc.contributor.alternative | 高梨, 優 | ja |
dc.date.accessioned | 2011-11-09T04:35:58Z | - |
dc.date.available | 2011-11-09T04:35:58Z | - |
dc.date.issued | 2011-12 | - |
dc.identifier.issn | 0378-7753 | - |
dc.identifier.uri | http://hdl.handle.net/2433/149214 | - |
dc.description.abstract | Solid electrolyte interface (SEI) films formed on Li_{1−x}CoO_2 electrodes were observed with hard X-ray photoelectron spectroscopy (HX-PES). This paper particularly focuses on film thickness estimation using HX-PES with theoretical calculation. The validity of the calculation was proven by experiments using model SEI films. The native film formed on a LiCoO2 composite electrode was estimated to be LiF with its thickness of 5 nm. Formation of Co (II) species on top of LiCoO_2 was also indicated. Storage of the electrode at 60 °C brought about considerable film growth (30–40 nm) with carbonate compounds formation. SEI film changes during charging of the LiCoO_2 electrode were also examined. The main component in the film was deduced to be LiF or a kind of fluorite, with its thickness decreased during charging. The SEI formation mechanisms are also elucidated. | en |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | Elsevier B.V. | en |
dc.rights | © 2011 Elsevier B.V. | en |
dc.rights | This is not the published version. Please cite only the published version. | en |
dc.rights | この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。 | ja |
dc.title | Thickness estimation of interface films formed on Li_{1−x}CoO2 electrodes by hard X-ray photoelectron spectroscopy | en |
dc.type | journal article | - |
dc.type.niitype | Journal Article | - |
dc.identifier.ncid | AA00705373 | - |
dc.identifier.jtitle | Journal of Power Sources | en |
dc.identifier.volume | 196 | - |
dc.identifier.issue | 24 | - |
dc.identifier.spage | 10679 | - |
dc.identifier.epage | 10685 | - |
dc.relation.doi | 10.1016/j.jpowsour.2011.08.097 | - |
dc.textversion | author | - |
dcterms.accessRights | open access | - |
出現コレクション: | 学術雑誌掲載論文等 |
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