Nanostructure characterization of Co–Pd–Si–O soft magnetic nanogranular film using small-angle X-ray and neutronscattering

Abstract

The nanostructure of a Co–Pd–Si–O nanogranular film was investigated with the combined use of small-angle x-ray (SAXS) and neutron scattering (SANS). Using a new, compact type of SANS instrument, the SANS profiles of individual particles with a diameter of about 2–4 nm were successfully observed. The structures of magnetic regions were found to be the same as the chemical structures of the particles, and a sharp interface was observed between the matrix and the particles. The SAXS to SANS ratio clearly indicates that the particles are a CoPd alloy and the matrix is not pure SiO2. In fact, the matrix is composed of a meaningful amountof Co.