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dc.contributor.authorNakajima, Kaoruen
dc.contributor.authorMiyashita, Motokien
dc.contributor.authorSuzuki, Motofumien
dc.contributor.authorKimura, Kenjien
dc.contributor.alternative木村, 健二ja
dc.date.accessioned2014-01-09T05:41:53Z-
dc.date.available2014-01-09T05:41:53Z-
dc.date.issued2013-12-14-
dc.identifier.issn0021-9606-
dc.identifier.urihttp://hdl.handle.net/2433/180089-
dc.description.abstractSurface structures of binary mixtures of imidazolium-based ionic liquids having a common anion (bis(trifluoromethanesulfonyl)imide ([TFSI]), namely [C2MIM]1-x[C10MIM]x[TFSI] (x = 0.5 and 0.1), are studied using high-resolution Rutherford backscattering spectroscopy (HRBS) and time of flight secondary ion mass spectroscopy (TOF-SIMS). Although both measurements show surface segregation of [C10MIM] the degrees of the segregation are different. The surface fraction xsurf of [C10MIM] is estimated to be 0.6 ± 0.05 and 0.18 ± 0.02 by HRBS for x = 0.5 and 0.1, respectively. On the other hand, TOF-SIMS indicates much stronger surface segregation, namely xsurf = 0.83 ± 0.03 and 0.42 ± 0.04 for x = 0.5 and 0.1, respectively. The observed discrepancy can be attributed to the difference in the probing depth between HRBS and TOF-SIMS. The observed surface segregation can be roughly explained in terms of surface tension.en
dc.format.mimetypeapplication/pdf-
dc.language.isoeng-
dc.publisherAmerican Institute of Physicsen
dc.rights© 2013 AIP Publishing LLC.en
dc.titleSurface structures of binary mixtures of imidazolium-based ionic liquids using high-resolution Rutherford backscattering spectroscopy and time of flight secondary ion mass spectroscopy.en
dc.typejournal article-
dc.type.niitypeJournal Article-
dc.identifier.ncidAA00694991-
dc.identifier.jtitleThe Journal of chemical physicsen
dc.identifier.volume139-
dc.identifier.issue22-
dc.relation.doi10.1063/1.4838376-
dc.textversionpublisher-
dc.identifier.artnum224701-
dc.identifier.pmid24329076-
dcterms.accessRightsopen access-
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