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dc.contributor.author | Okamoto, Norihiko L. | en |
dc.contributor.author | Kashioka, Daisuke | en |
dc.contributor.author | Hirato, Tetsuji | en |
dc.contributor.author | Inui, Haruyuki | en |
dc.contributor.alternative | 岡本, 範彦 | ja |
dc.date.accessioned | 2014-05-21T02:45:07Z | - |
dc.date.available | 2014-05-21T02:45:07Z | - |
dc.date.issued | 2014-05 | - |
dc.identifier.issn | 0749-6419 | - |
dc.identifier.uri | http://hdl.handle.net/2433/187145 | - |
dc.description.abstract | The compression deformation behavior of electrodeposited nanocrystalline copper pillars with average grain sizes (d) of 360, 100, and 34 nm has been investigated as a function of specimen size (D). The yield stress for nanocrystalline pillars with d = 360 and 100 nm does not depend on specimen size, exhibiting essentially the bulk yield stress until the specimen size is reduced down to the critical values ((D/d)∗ = 35 and 85), below which the yield stress decreases with the decrease in specimen size. In contrast, the yield stress for nanocrystalline pillars with d = 34 nm does not depend much on specimen size, exhibiting the bulk yield stress value for all specimen sizes investigated. The dominant deformation mechanism changes from dislocation glide for pillars with d = 360 and 100 nm to grain boundary diffusional creep for pillars with d = 34 nm. Grain-size induced softening occurs for pillars with d = 34 nm being consistent with the occurrence of change in deformation mechanisms, whereas the bulk yield stress for pillars with d = 360 and 100 nm increases with the decrease in grain size according to the classical Hall–Petch relationship. The critical (D/d)∗ values determined for nanocrystalline Cu pillars with d = 360 and 100 nm increases with the decrease in grain size so as to conform to the same power law scaling obtained for coarse-grained Cu polycrystals. This is the first indication that the specimen size-induced softening extends from micrometer to nanometer scales as far as the dominant deformation mechanism is dislocation glide. The considerably large critical (D/d)∗ values determined for nanocrystalline Cu pillars with d = 360 and 100 nm are discussed in terms of strain continuity among neighboring grains and the generation of geometrically necessary dislocations to maintain strain continuity at the grain boundaries. | en |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | Elsevier Ltd. | en |
dc.rights | © 2013 Elsevier Ltd. | en |
dc.rights | この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。 | ja |
dc.rights | This is not the published version. Please cite only the published version. | en |
dc.subject | Dislocations (A) | en |
dc.subject | Crystal plasticity (B) | en |
dc.subject | Polycrystalline material (B) | en |
dc.subject | Mechanical testing (C) | en |
dc.subject | Focused ion beam (FIB) method | en |
dc.title | Specimen- and grain-size dependence of compression deformation behavior in nanocrystalline copper | en |
dc.type | journal article | - |
dc.type.niitype | Journal Article | - |
dc.identifier.ncid | AA10455873 | - |
dc.identifier.jtitle | International Journal of Plasticity | en |
dc.identifier.volume | 56 | - |
dc.identifier.spage | 173 | - |
dc.identifier.epage | 183 | - |
dc.relation.doi | 10.1016/j.ijplas.2013.12.003 | - |
dc.textversion | author | - |
dcterms.accessRights | open access | - |
出現コレクション: | 学術雑誌掲載論文等 |
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