ダウンロード数: 320
このアイテムのファイル:
ファイル | 記述 | サイズ | フォーマット | |
---|---|---|---|---|
transinf.E97.D.2095.pdf | 1.19 MB | Adobe PDF | 見る/開く |
完全メタデータレコード
DCフィールド | 値 | 言語 |
---|---|---|
dc.contributor.author | SHINTANI, Michihiro | en |
dc.contributor.author | SATO, Takashi | en |
dc.contributor.alternative | 佐藤, 高史 | ja |
dc.date.accessioned | 2014-09-05T08:10:58Z | - |
dc.date.available | 2014-09-05T08:10:58Z | - |
dc.date.issued | 2014-08-01 | - |
dc.identifier.issn | 0916-8532 | - |
dc.identifier.uri | http://hdl.handle.net/2433/189588 | - |
dc.description.abstract | We propose a novel IDDQ outlier screening flow through a two-phase approach: a clustering-based filtering and an estimation-based current-threshold determination. In the proposed flow, a clustering technique first filters out chips that have high IDDQ current. Then, in the current-threshold determination phase, device-parameters of the unfiltered chips are estimated based on measured IDDQ currents through Bayesian inference. The estimated device-parameters will further be used to determine a statistical leakage current distribution for each test pattern and to calculate a and suitable current-threshold. Numerical experiments using a virtual wafer show that our proposed technique is 14 times more accurate than the neighbor nearest residual (NNR) method and can achieve 80% of the test escape in the case of small leakage faults whose ratios of leakage fault sizes to the nominal IDDQ current are above 40%. | en |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | IEICE(電子情報通信学会) | en |
dc.rights | © 2014 IEICE | en |
dc.subject | IDDQ testing | en |
dc.subject | k-means clustering | en |
dc.subject | statistical leakage current analysis | en |
dc.subject | Bayes' theorem | en |
dc.subject | simulated annealing | en |
dc.title | IDDQ Outlier Screening through Two-Phase Approach: Clustering-Based Filtering and Estimation-Based Current-Threshold Determination | en |
dc.type | journal article | - |
dc.type.niitype | Journal Article | - |
dc.identifier.ncid | AA10826272 | - |
dc.identifier.jtitle | IEICE Transactions on Information and Systems | en |
dc.identifier.volume | E97.D | - |
dc.identifier.issue | 8 | - |
dc.identifier.spage | 2095 | - |
dc.identifier.epage | 2104 | - |
dc.relation.doi | 10.1587/transinf.E97.D.2095 | - |
dc.textversion | publisher | - |
dcterms.accessRights | open access | - |
出現コレクション: | 学術雑誌掲載論文等 |
このリポジトリに保管されているアイテムはすべて著作権により保護されています。