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| ファイル | 記述 | サイズ | フォーマット | |
|---|---|---|---|---|
| 1742-6596_443_1_012031.pdf | 436.76 kB | Adobe PDF | 見る/開く |
| タイトル: | Vacancy migration process in F82H and Fe-Cr binary alloy using positron annihilation lifetime measurement |
| 著者: | Sato, K. Xu, Q. Hamaguchi, D. Huang, S. S. Yoshiie, T. |
| 発行日: | Jun-2013 |
| 出版者: | IOP Publishing |
| 誌名: | Journal of Physics: Conference Series |
| 巻: | 443 |
| 論文番号: | 012031 |
| 抄録: | Microstructral evolution of electron-irradiated F82H and Fe-8%Cr at 77 K was studied using positron annihilation lifetime measurements. Irradiation-induced vacancies started to migrate at 300 K and 180 K in F82H and Fe-8%Cr, respectively. Solute Cr atoms did not suppress vacancy migration, but they made di-vacancies more stable. Microvoids were not formed by annealing. In F82H, solute atoms acted as trapping site of irradiation-induced defects and annihilation of vacancies and interstitials was facilitated. Pre-existing dislocations and precipitates were also their sinks. These lead to the suppression of microvoids formation. In Fe-8%Cr, small vacancy-type dislocation loops were formed by isochronal annealing test |
| 記述: | "16th International Conference on Positron Annihilation (ICPA-16)" 19–24 August 2012, H H Wills Physics Laboratory, University of Bristol, UK |
| 著作権等: | Content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence. |
| URI: | http://hdl.handle.net/2433/193699 |
| DOI(出版社版): | 10.1088/1742-6596/443/1/012031 |
| 出現コレクション: | 学術雑誌掲載論文等 |
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