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dc.contributor.author | MAKINO, Toshiro | en |
dc.contributor.author | WAKABAYASHI, Hidenobu | en |
dc.contributor.alternative | 牧野, 俊郎 | ja |
dc.date.accessioned | 2015-04-20T02:59:02Z | - |
dc.date.available | 2015-04-20T02:59:02Z | - |
dc.date.issued | 2011-03-22 | - |
dc.identifier.issn | 1880-5566 | - |
dc.identifier.uri | http://hdl.handle.net/2433/197340 | - |
dc.description.abstract | In this work we develop a new spectrophotometer system for measuring thermal radiation characteristics of real surfaces of thermal engineering. This system measures transition of spectra of normal incidence hemispherical reflectance RNH, normal incidence specular reflectance RNN, normal incidence diffuse reflectance RND, normal incidence absorptance AN and normal emittance εN of real surfaces in a near-ultraviolet through infrared region of wavelength 0.30∼11 µm simultaneously and repeatedly with a cycle time of 6 s. The system is applied to measure the spectrum transition of the reflectances, absorptance and emittance of a nickel surface which is prepared as a clean optically smooth surface and is oxidized in high-temperature air to be changed to an oxidized rough real surface. Microscopic mechanisms of the spectrum transition are discussed, to illustrate the performance of the developed spectrophotometer system for thermal engineering applications. | en |
dc.format.mimetype | application/pdf | - |
dc.language.iso | eng | - |
dc.publisher | Japan Society of Mechanical Engineers / Heat Transfer Society of Japan | en |
dc.rights | © 2011 by The Japan Society of Mechanical Engineers and The Heat Transfer Society of Japan | en |
dc.rights | この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。 | ja |
dc.rights | This is not the published version. Please cite only the published version. | en |
dc.subject | Thermal Radiation | en |
dc.subject | Spectroscopic Measurement | en |
dc.subject | Simultaneous Measurement | en |
dc.subject | Reflectance | en |
dc.subject | Absorptance | en |
dc.subject | Emittance | en |
dc.subject | Real Surface | en |
dc.title | New Spectrophotometer System for Measuring Thermal Radiation Characteristics of Real Surfaces of Thermal Engineering Entirely | en |
dc.type | journal article | - |
dc.type.niitype | Journal Article | - |
dc.identifier.jtitle | Journal of Thermal Science and Technology | en |
dc.identifier.volume | 6 | - |
dc.identifier.issue | 1 | - |
dc.identifier.spage | 80 | - |
dc.identifier.epage | 92 | - |
dc.relation.doi | 10.1299/jtst.6.80 | - |
dc.textversion | author | - |
dcterms.accessRights | open access | - |
出現コレクション: | 学術雑誌掲載論文等 |
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