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タイトル: | Helium atom line-intensity ratios as an integrated diagnostic tool for low-pressure and low-density plasmas |
著者: | Ueda, Akira Shikama, Taiichi Teramoto, Tatsuya Higashi, Takanori Iida, Yohei Hasuo, Masahiro ![]() ![]() ![]() |
著者名の別形: | 四竃, 泰一 蓮尾, 昌裕 |
発行日: | May-2018 |
出版者: | AIP Publishing |
誌名: | Physics of Plasmas |
巻: | 25 |
号: | 5 |
論文番号: | 054508 |
抄録: | The intensity ratios between specific pairs of helium atom (HeI) emission lines are functions of the electron temperature (Te) and density (ne), and these functions have been used for the analysis of Te and ne in various types of discharge plasma. We applied this method to a low-density (ne < 10¹⁸ m⁻³) plasma, where the procedure of the analysis is markedly different from that of higher-density plasmas. The 2¹S and 2³S metastable atom densities are affected by transport, making it practically necessary to set Te, ne, the metastable atom densities, and the optical escape factors, which represent the effect of photoexcitation, as unknown variables and determine them simultaneously. Conversely, the transport of metastable atoms can be evaluated from the analysis. |
著作権等: | This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Physics of Plasmas 25, 054508 (2018) and may be found at https://doi.org/10.1063/1.5027167. |
URI: | http://hdl.handle.net/2433/242933 |
DOI(出版社版): | 10.1063/1.5027167 |
出現コレクション: | 学術雑誌掲載論文等 |

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