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このアイテムのファイル:
| ファイル | 記述 | サイズ | フォーマット | |
|---|---|---|---|---|
| xrs.3261.pdf | 4.05 MB | Adobe PDF | 見る/開く |
| タイトル: | Polarization and intensity of Compton scattering |
| 著者: | Saito, Naoki Tanaka, Ryohei Kawai, Jun   https://orcid.org/0000-0002-1289-7666 (unconfirmed) |
| 著者名の別形: | 齋藤, 直樹 田中, 亮平 河合, 潤 |
| キーワード: | Doppler effect polarization XRF polarized X-rays white X-ray polarization |
| 発行日: | Jan-2022 |
| 出版者: | Wiley |
| 誌名: | X-Ray Spectrometry |
| 巻: | 51 |
| 号: | 1 |
| 開始ページ: | 86 |
| 終了ページ: | 90 |
| 抄録: | X-ray spectra scattered at 90° by acrylic resin plates of various thicknesses are measured. The intensity and polarization of Compton-scattered X-rays are estimated from the spectra. As the thickness of the slab increases, the intensity increases but the polarization decreases. The optimal thickness for a polarized X-ray fluorescence spectrometer is determined, which provides both high intensity and high polarization. |
| 著作権等: | © 2021 The Authors. X-Ray Spectrometry published by John Wiley & Sons Ltd. This is an open access article under the terms of the Creative Commons Attribution-NonCommercial License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited and is not used for commercial purposes. |
| URI: | http://hdl.handle.net/2433/278979 |
| DOI(出版社版): | 10.1002/xrs.3261 |
| 出現コレクション: | 学術雑誌掲載論文等 |
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