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dc.contributor.authorTakane, Hitoshien
dc.contributor.authorOshima, Takayoshien
dc.contributor.authorHarada, Takayukien
dc.contributor.authorKaneko, Kentaroen
dc.contributor.authorTanaka, Katsuhisaen
dc.contributor.alternative高根, 倫史ja
dc.contributor.alternative大島, 孝仁ja
dc.contributor.alternative原田, 尚之ja
dc.contributor.alternative金子, 健太郎ja
dc.contributor.alternative田中, 勝久ja
dc.date.accessioned2024-01-23T05:48:34Z-
dc.date.available2024-01-23T05:48:34Z-
dc.date.issued2024-01-
dc.identifier.urihttp://hdl.handle.net/2433/286749-
dc.descriptionTiO₂に格子整合した高品質ルチル型GeₓSn₁−ₓO₂デバイスの動作実証 --高耐圧パワーデバイスへの応用--. 京都大学プレスリリース. 2024-01-19.ja
dc.description.abstractWe report the characterization and application of mist-CVD-grown rutile-structured Ge_xSn_{1−x}O_2 (x = ∼0.53) films lattice-matched to isostructural TiO_2(001) substrates. The grown surface was flat throughout the growth owing to the lattice-matching epitaxy. Additionally, the film was single-crystalline without misoriented domains and TEM-detectable threading dislocations due to the coherent heterointerface. Using the Ge_{0.49}Sn_{0.51}O_2 film with a carrier density of 7.8 × 10^{18} cm^{−3} and a mobility of 24 cm^2V^{−1}s^{−1}, lateral Schottky barrier diodes were fabricated with Pt anodes and Ti/Au cathodes. The diodes exhibited rectifying properties with a rectification ratio of 8.2 × 10^4 at ±5 V, showing the potential of Ge_xSn_{1−x}O_2 as a practical semiconductor.en
dc.language.isoeng-
dc.publisherIOP Publishingen
dc.publisherThe Japan Society of Applied Physicsen
dc.rights© 2024 The Author(s). Published on behalf of The Japan Society of Applied Physics by IOP Publishing Ltden
dc.rightsContent from this work may be used under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.en
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/-
dc.titleRutile-type Ge_xSn_{1−x}O_2 alloy layers lattice-matched to TiO_2 substrates for device applicationsen
dc.typejournal article-
dc.type.niitypeJournal Article-
dc.identifier.jtitleApplied Physics Expressen
dc.identifier.volume17-
dc.identifier.issue1-
dc.relation.doi10.35848/1882-0786/ad15f3-
dc.textversionpublisher-
dc.identifier.artnum011008-
dc.addressDepartment of Material Chemistry, Kyoto Universityen
dc.addressResearch Center for Electronic and Optical Materials, National Institute for Materials Scienceen
dc.addressResearch Center for Materials Nanoarchitechtonics, National Institute for Materials Scienceen
dc.addressResearch Organization of Science and Technology, Ritsumeikan Universityen
dc.addressDepartment of Material Chemistry, Kyoto Universityen
dc.relation.urlhttps://www.t.kyoto-u.ac.jp/ja/research/topics/20240119-
dcterms.accessRightsopen access-
datacite.awardNumber21H01811-
datacite.awardNumber.urihttps://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-21H01811/-
dc.identifier.pissn1882-0778-
dc.identifier.eissn1882-0786-
jpcoar.funderName日本学術振興会ja
jpcoar.awardTitle超ワイドギャップp型遷移金属酸化物の創成とデバイス応用ja
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