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dc.contributor.authorMatsunaga, Wataruen
dc.contributor.authorMizutani, Yoshihiroen
dc.contributor.alternative松永, 航ja
dc.date.accessioned2024-03-18T03:00:22Z-
dc.date.available2024-03-18T03:00:22Z-
dc.date.issued2024-
dc.identifier.urihttp://hdl.handle.net/2433/287394-
dc.description.abstractEIT was found recently that it can also be applied to dielectrics under a high-frequency AC voltage. However, the EIT evaluation method for dielectrics has not been established sufficiently; in particular, there are no example studies of the drawing of impedance plane diagrams, which is widely used as an evaluation method for eddy current testing (ECT). Therefore, we have attempted to draw an impedance plane diagram based on the Ampère-Maxwell equation and a simple electrical circuit, as performed in ECT. First, a theoretical solution for the impedance based on the Ampère-Maxwell equation that considers eddy and displacement currents was derived, and impedance plane diagrams were then drawn. From the impedance plane diagrams obtained, it was shown that the same trends can be drawn for the diagrams for both conductors and dielectrics. Next, an electrical circuit model for EIT was proposed that takes into account both the conductivity and the permittivity. Using this model, impedance plane diagrams for conductors and dielectrics were drawn, and for dielectrics in particular, it was shown that the diagrams can be drawn by considering the conductivity. In addition, similar to the impedance plane diagrams drawn from the electrical circuit model and derived from the Ampère-Maxwell equation, the change behavior in the diagrams clearly differs between the cases where the conductivity and permittivity change and the case where the lift-off changes. This demonstrates the effectiveness of the electrical circuit model in providing a qualitative understanding of the effects of the dielectric conditions and measurement conditions on EIT.en
dc.language.isoeng-
dc.publisherSpringer Natureen
dc.rightsThis version of the article has been accepted for publication, after peer review (when applicable) and is subject to Springer Nature’s AM terms of use, but is not the Version of Record and does not reflect post-acceptance improvements, or any corrections. The Version of Record is available online at: http://dx.doi.org/10.1007/s10921-024-01045-0en
dc.rightsThe full-text file will be made open to the public on 26 February 2025 in accordance with publisher's 'Terms and Conditions for Self-Archiving'.en
dc.rightsThis is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。en
dc.subjectNondestructive evaluationen
dc.subjectElectromagnetic induction testingen
dc.subjectDielectricsen
dc.subjectImpedance plane diagramen
dc.titleEvaluation Method for Electromagnetic Induction Testing of Dielectrics Using Impedance Plane Diagrams Drawn Using Ampère-Maxwell Equation and Simple Electrical Circuit Modelen
dc.typejournal article-
dc.type.niitypeJournal Article-
dc.identifier.jtitleJournal of Nondestructive Evaluationen
dc.identifier.volume43-
dc.relation.doi10.1007/s10921-024-01045-0-
dc.textversionauthor-
dc.identifier.artnum30-
dcterms.accessRightsembargoed access-
datacite.date.available2025-02-26-
datacite.awardNumber20J21500-
datacite.awardNumber.urihttps://kaken.nii.ac.jp/grant/KAKENHI-PROJECT-20J21500/-
dc.identifier.pissn0195-9298-
dc.identifier.eissn1573-4862-
jpcoar.funderName日本学術振興会ja
jpcoar.awardTitleCFRP接着接合部におけるウィークボンドを検出可能な電磁誘導探傷法の開発ja
出現コレクション:学術雑誌掲載論文等

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