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dc.contributor.authorChen, Shaoqiangen
dc.contributor.authorZhu, Linen
dc.contributor.authorYoshita, Masahiroen
dc.contributor.authorMochizuki, Toshimitsuen
dc.contributor.authorKim, Changsuen
dc.contributor.authorAkiyama, Hidefumien
dc.contributor.authorImaizumi, Mitsuruen
dc.contributor.authorKanemitsu, Yoshihikoen
dc.contributor.alternative金光, 義彦ja
dc.date.accessioned2025-05-06T23:54:37Z-
dc.date.available2025-05-06T23:54:37Z-
dc.date.issued2015-01-16-
dc.identifier.urihttp://hdl.handle.net/2433/293758-
dc.description.abstractWorld-wide studies on multi-junction (tandem) solar cells have led to record-breaking improvements in conversion efficiencies year after year. To obtain detailed and proper feedback for solar-cell design and fabrication, it is necessary to establish standard methods for diagnosing subcells in fabricated tandem devices. Here, we propose a potential standard method to quantify the detailed subcell properties of multi-junction solar cells based on absolute measurements of electroluminescence (EL) external quantum efficiency in addition to the conventional solar-cell external-quantum-efficiency measurements. We demonstrate that the absolute-EL-quantum-efficiency measurements provide I-V relations of individual subcells without the need for referencing measured I-V data, which is in stark contrast to previous works. Moreover, our measurements quantify the absolute rates of junction loss, non-radiative loss, radiative loss, and luminescence coupling in the subcells, which constitute the 'balance sheets' of tandem solar cells.en
dc.language.isoeng-
dc.publisherNature Publishing Groupen
dc.rightsThis work is licensed under a Creative Commons Attribution-NonCommercial-ShareAlike 4.0 International License. The images or other third party material in this article are included in the article's Creative Commons license, unless indicated otherwise in the credit line; if the material is not included under the Creative Commons license, users will need to obtain permission from the license holder in order to reproduce the material. To view a copy of this license, visit http://creativecommons.org/licenses/by-nc-sa/4.0/en
dc.rights.urihttp://creativecommons.org/licenses/by-nc-sa/4.0/-
dc.titleThorough subcells diagnosis in a multi-junction solar cell via absolute electroluminescence-efficiency measurementsen
dc.typejournal article-
dc.type.niitypeJournal Article-
dc.identifier.jtitleScientific Reportsen
dc.identifier.volume5-
dc.relation.doi10.1038/srep07836-
dc.textversionpublisher-
dc.identifier.artnum7836-
dc.identifier.pmid25592484-
dc.relation.urlhttp://api.elsevier.com/content/abstract/scopus_id/84930027551-
dcterms.accessRightsopen access-
dc.identifier.pissn2045-2322-
出現コレクション:学術雑誌掲載論文等

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