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dc.contributor.authorGotoh, Yen
dc.contributor.authorKubo, Hen
dc.contributor.authorTsuji, Hen
dc.contributor.authorIshikawa, Jen
dc.date.accessioned2007-06-14T06:23:25Z-
dc.date.available2007-06-14T06:23:25Z-
dc.date.issued2000-02-
dc.identifier.issn0034-6748-
dc.identifier.urihttp://hdl.handle.net/2433/39803-
dc.description.abstractThe performance of a compact microwaveion source developed for extremely low energy ion extraction was measured. The ion source was modified to be fitted for the ion extraction at the voltage lower than 100 V. The current–voltage characteristics, mass spectrum, absolute ion energy, and energy spread of argon ion beam were estimated with a sector magnet. The results showed that the mass spectrum showed a clear separation of singly charged ions and doubly charged ions even at the extraction voltage of 4 V. Mass separated Ar[+] current of 0.5 nA at 4 V extraction was obtained. An excess ion energy due to presence of plasma potential was 14 eV at the pressure of 5×10[−3] Pa, and 66 eV at 9×10[−4] Pa. Energy spread was narrower than 12 eV, from rough estimate of the mass spectrum. These results summarize that the present ion source can be used for extremely low energy ion irradiation system.en
dc.format.extent50777 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoeng-
dc.publisherAmerican Institute of Physicsen
dc.rightsCopyright 2000 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.en
dc.titleCompact microwave ion source for extremely low energy ion irradiation systemen
dc.typejournal article-
dc.type.niitypeJournal Article-
dc.identifier.jtitleREVIEW OF SCIENTIFIC INSTRUMENTSen
dc.identifier.volume71-
dc.identifier.issue2-
dc.identifier.spage1160-
dc.identifier.epage1162-
dc.relation.doi10.1063/1.1150415-
dc.textversionpublisher-
dcterms.accessRightsopen access-
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