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書誌情報ファイル
Effect of surface oxidation on stability of LHD conductor immersed in pressurized HeII
  Ohya, M; Shirai, Y; Shiotsu, M; Imagawa, S (2006-06)
  IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 16(2): 739-742
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Current limiting characteristics of superconducting fault current limiter with parallel and series connection in experimental power system
  Shirai, Y; Mochida, A; Shiotsu, M; Hatta, H; Oide, T; Nitta, T (2004-06)
  IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 14(2): 871-874
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Repetitive operation of three-phase superconducting fault current limiter in a model power system
  Shirai, Y; Mochida, A; Morimoto, T; Shiotsu, M; Oide, T; Chiba, M; Nitta, T (2005-06)
  IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 15(2): 2110-2113
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Over-voltage suppression in a fault current limiter by a ZnO varistor
  Shirai, Y; Miyato, Y; Taguchi, M; Shiotsu, M; Hatta, H; Muroya, S; Chiba, M; Nitta, T (2003-06)
  IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 13(2): 2064-2067
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Simulation study on operating characteristics of superconducting fault current limiter in one-machine infinite bus power system
  Shirai, Y; Taguchi, M; Shiotsu, M; Hatta, H; Nitta, T (2003-06)
  IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 13(2): 1822-1827
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Heat transfer on a flat plate at one end of a series-connected rectangular duct in pressurized HeII
  Tatsumoto, H; Hata, K; Hama, K; Shirai, Y; Shiotsu, M (2002-03)
  IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 12(1): 1364-1367
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Stability of superconducting wire with various surface conditions in pressurized HeII (1) - Experimental results
  Ohya, M; Shigemasu, S; Shirai, Y; Shiotsu, M; Imagawa, S (2005-06)
  IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 15(2): 1703-1706
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Stability of superconducting wire with various surface conditions in pressurized HeII (2) - Numerical analysis
  Shigemasu, S; Ohya, A; Shirai, Y; Shiotsu, M; Imagawa, S (2005-06)
  IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 15(2): 1707-1710
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Effect of orifice location on heat transfer in a duct filled with pressurized HeII
  Konishi, S; Fujita, K; Okamura, T; Shirai, Y; Shiotsu, M (2004-06)
  IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 14(2): 1762-1765
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Cooling stability test of HeII cooled LHD conductor (2) - Experimental results
  Ohya, M; Higuchi, A; Shirai, Y; Shiotsu, M; Imagawa, S (2004-06)
  IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 14(2): 1447-1450
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