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書誌情報 | ファイル |
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Transient stability of large helical device conductor with and without aluminum stabilizer (2) - Numerical results Shirai, Y; Ohya, M; Ikuta, R; Shiotsu, M; Imagawa, S (2007-06) IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 17(2): 2458-2461 | |
Transient stability of large helical device conductor with and without aluminum stabilizer (1) - Experimental results Ikuta, R; Ohya, M; Shirai, Y; Shiotsu, M; Imagawa, S (2007-06) IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 17(2): 2454-2457 | |
Effect of surface oxidation on stability of LHD conductor immersed in pressurized HeII Ohya, M; Shirai, Y; Shiotsu, M; Imagawa, S (2006-06) IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 16(2): 739-742 | |
Stability of superconducting wire with various surface conditions in pressurized HeII (1) - Experimental results Ohya, M; Shigemasu, S; Shirai, Y; Shiotsu, M; Imagawa, S (2005-06) IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 15(2): 1703-1706 | |
Stability of superconducting wire with various surface conditions in pressurized HeII (2) - Numerical analysis Shigemasu, S; Ohya, A; Shirai, Y; Shiotsu, M; Imagawa, S (2005-06) IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 15(2): 1707-1710 | |
Cooling stability test of HeII cooled LHD conductor (2) - Experimental results Ohya, M; Higuchi, A; Shirai, Y; Shiotsu, M; Imagawa, S (2004-06) IEEE TRANSACTIONS ON APPLIED SUPERCONDUCTIVITY, 14(2): 1447-1450 |
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