Crystal Structure Analysis of C60 Low Temperature Phase by Electron Crystallography with Cryo-TEM (STATES AND STRUCTURES-Crystal Information Analysis)

Abstract

The crystal structure of C60 at liquid helium temperature was examined by electron diffraction method using an imaging plate and cryo-TEM. The R factor could be reduced to a certain amount by assuming a multi-component crystal. Disorder in the crystal might be an important factor as well as dynamical scattering effect to be considered in electron crystallography for analyzing structures of thin crystals.