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dc.contributor.authorAlfieri, Giovannien
dc.contributor.authorKimoto, Tsunenobuen
dc.date.accessioned2008-11-17T03:01:11Z-
dc.date.available2008-11-17T03:01:11Z-
dc.date.issued2007-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/2433/67215-
dc.language.isoeng-
dc.publisherAMER INST PHYSICSen
dc.titleDeep level transient spectroscopy study of defects in hydrogen implanted p-type 4H-SiCen
dc.typejournal article-
dc.type.niitypeJournal Article-
dc.identifier.jtitleJOURNAL OF APPLIED PHYSICSen
dc.identifier.volume101-
dc.identifier.issue10-
dc.textversionnone-
dc.identifier.artnum103716-
dcterms.accessRightsmetadata only access-
Appears in Collections:Graduate School of Engineering Literature Database

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