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High-resolution diffraction microscopy using the plane-wave field of a nearly diffraction limited focused x-ray beam
  Takahashi, Yukio; Nishino, Yoshinori; Tsutsumi, Ryosuke; Kubo, Hideto; Furukawa, Hayato; Mimura, Hidekazu; Matsuyama, Satoshi; Zettsu, Nobuyuki; Matsubara, Eiichiro; Ishikawa, Tetsuya; Yamauchi, Kazuto (2009-08)
  PHYSICAL REVIEW B, 80(5)
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High-resolution diffraction microscopy using the plane-wave field of a nearly diffraction limited focused x-ray beam
  Takahashi, Yukio; Nishino, Yoshinori; Tsutsumi, Ryosuke; Kubo, Hideto; Furukawa, Hayato; Mimura, Hidekazu; Matsuyama, Satoshi; Zettsu, Nobuyuki; Matsubara, Eiichiro; Ishikawa, Tetsuya; Yamauchi, Kazuto (2009)
  PHYSICAL REVIEW B, 80(5)

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