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書誌情報ファイル
Characterization of nanotextured AIN thin films by x-ray absorption near-edge structures
  Suga, T; Kameyama, S; Yoshioka, S; Yamamoto, T; Tanaka, I; Mizoguchi, T (2005)
  APPLIED PHYSICS LETTERS, 86(16)
Electron energy loss near-edge structures of cubic Si3N4
  Tanaka, I; Mizoguchi, T; Sekine, T; He, H; Kimoto, K; Kobayashi, T; Mo, SD; Ching, WY (2001)
  APPLIED PHYSICS LETTERS, 78(15): 2134-2136
Core-hole effect on dipolar and quadrupolar transitions of SrTiO3 and BaTiO3 at TiK edge
  Yamamoto, T; Mizoguchi, T; Tanaka, I (2005)
  PHYSICAL REVIEW B, 71(24)
Theoretical prediction of ELNES/XANES and chemical bondings of AlN polytypes
  Mizoguchi, T; Tanaka, I; Kunisu, M; Yoshiya, M; Adachi, H; Ching, WY (2003)
  MICRON, 34(3-5): 249-254
Positron annihilation study of formation of Mg vacancy in MgO
  Mizuno, M; Inoue, Y; Sugita, K; Araki, H; Shirai, Y; Mizoguchi, T; Tanaka, I; Adachi, H (2004)
  POSITRON ANNIHILATION, ICPA-13, PROCEEDINGS, 445-4: 153-155
First-principles multi-electron calculations for L-2,L-3 ELNES/XANES of 3d transition metal monoxides
  Ikeno, H; Mizoguchi, T; Koyama, Y; Kumagai, Y; Tanaka, I (2006)
  ULTRAMICROSCOPY, 106(11-12): 970-975
Distribution of solute atoms in beta- and spinel Si(6-)zAl(z)O(z)N(8-z) by AlK-edge x-ray absorption near-edge structure
  Tatsumi, K; Mizoguchi, T; Yoshioka, S; Yamamoto, T; Suga, T; Sekine, T; Tanaka, I (2005)
  PHYSICAL REVIEW B, 71(3)
X-ray absorption near edge structures of silicon nitride thin film by pulsed laser deposition
  Suga, T; Mizoguchi, T; Kunisu, M; Tatsumi, K; Yamamoto, T; Tanaka, I; Sekine, T (2004)
  MATERIALS TRANSACTIONS, 45(7): 2039-2041
The study of Al-L-23 ELNES with resolution-enhancement software and first-principles calculation
  Kimoto, K; Ishizuka, K; Mizoguchi, T; Tanaka, I; Matsui, Y (2003)
  JOURNAL OF ELECTRON MICROSCOPY, 52(3): 299-303
Peak assignments of ELNES and XANES using overlap population diagrams
  Mizoguchi, T; Tatsumi, K; Tanaka, I (2006)
  ULTRAMICROSCOPY, 106(11-12): 1120-1128