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書誌情報ファイル
Bandgap shift by quantum confinement effect in <100> Si-nanowires derived from threshold-voltage shift of fabricated metal-oxide-semiconductor field effect transistors and theoretical calculations
  Yoshioka, Hironori; Morioka, Naoya; Suda, Jun; Kimoto, Tsunenobu (2011-03-15)
  JOURNAL OF APPLIED PHYSICS, 109(6)
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Mobility oscillation by one-dimensional quantum confinement in Si-nanowire metal-oxide-semiconductor field effect transistors
  Yoshioka, Hironori; Morioka, Naoya; Suda, Jun; Kimoto, Tsunenobu (2009-08)
  JOURNAL OF APPLIED PHYSICS, 106(3)
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Mobility oscillation by one-dimensional quantum confinement in Si-nanowire metal-oxide-semiconductor field effect transistors
  Yoshioka, Hironori; Morioka, Naoya; Suda, Jun; Kimoto, Tsunenobu (2009)
  JOURNAL OF APPLIED PHYSICS, 106(3)
Influence of uniaxial mechanical stress on the high frequency performance of metal-oxide-semiconductor field effect transistors on (100) Si wafer
  Han, Younggun; Koganemaru, Masaaki; Ikeda, Toru; Miyazaki, Noriyuki; Choi, Woon; Tomokage, Hajime (2010)
  APPLIED PHYSICS LETTERS, 96(21)
Evaluation of Stress Effects on Electrical Characteristics of N-Type MOSFETs: Variations of DC Characteristics During the Resin-Molding Process
  Koganemaru, Masaaki; Ikeda, Toru; Miyazaki, Noriyuki; Tomokage, Hajime (2010)
  JOURNAL OF ELECTRONIC PACKAGING, 132(1)
Influence of uniaxial mechanical stress on the high frequency performance of metal-oxide-semiconductor field effect transistors on (100) Si wafer
  Han, Younggun; Koganemaru, Masaaki; Ikeda, Toru; Miyazaki, Noriyuki; Choi, Woon; Tomokage, Hajime (2010-05)
  APPLIED PHYSICS LETTERS, 96(21)
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