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dc.contributor.authorFunaki, Tsuyoshien
dc.contributor.authorArioka, Hisatoen
dc.contributor.authorHikihara, Takashien
dc.contributor.alternative引原, 隆士ja
dc.date.accessioned2010-05-10T05:57:03Z-
dc.date.available2010-05-10T05:57:03Z-
dc.date.issued2009-12-10-
dc.identifier.citationTsuyoshi Funaki, Hisato Arioka and Takashi Hikihara, "The influence of parasitic components on power MOSFET switching operation in power conversion circuits", IEICE Electron. Express, Vol. 6, No. 23, pp.1697-1701, (2009) .-
dc.identifier.issn1349-2543-
dc.identifier.urihttp://hdl.handle.net/2433/109957-
dc.description.abstractThis paper discusses the quantification of parasitic components inherent in printed circuit board (PCB) wiring, which can be of considerable value in power conversion circuits. The influence of parasitic inductance and mutual coupling are evaluated in terms of electromagnetic compatibility (EMC) for the switching operation of power MOSFETs in a dc-dc buck converter. The parasitic components are identified based on the partial element equivalent circuit (PEEC) method and modeled with circuit simulation. The estimated effect of the parasitic component on the switching operation of a power MOSFET is validated by comparing it with experimental results.en
dc.format.mimetypeapplication/pdf-
dc.language.isoeng-
dc.publisherIEICE - Institute of Electronics, Information and Communication Engineersen
dc.rightscopyright©2009 IEICEen
dc.subjectswitchingen
dc.subjectparasitic inductanceen
dc.subjectmutual couplingen
dc.subjectEMCen
dc.titleThe influence of parasitic components on power MOSFET switching operation in power conversion circuitsen
dc.typejournal article-
dc.type.niitypeJournal Article-
dc.identifier.jtitleIEICE Electronics Expressen
dc.identifier.volume6-
dc.identifier.issue23-
dc.identifier.spage1697-
dc.identifier.epage1701-
dc.relation.doi10.1587/elex.6.1697-
dc.textversionpublisher-
dcterms.accessRightsopen access-
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