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タイトル: Thickness estimation of interface films formed on Li_{1−x}CoO2 electrodes by hard X-ray photoelectron spectroscopy
著者: Takanashi, Yu
Orikasa, Yuki  KAKEN_id
Mogi, Masato
Oishi, Masatsugu
Murayama, Haruno  KAKEN_id
Sato, Kenji
Yamashige, Hisao
Takamatsu, Daiko
Fujimoto, Takahiro
Tanida, Hajime  KAKEN_id
Arai, Hajime  KAKEN_id
Ohta, Toshiaki
Matsubara, Eiichiro  KAKEN_id  orcid https://orcid.org/0000-0002-4557-2665 (unconfirmed)
Uchimoto, Yoshiharu  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-1491-2647 (unconfirmed)
Ogumi, Zempachi
著者名の別形: 高梨, 優
発行日: Dec-2011
出版者: Elsevier B.V.
誌名: Journal of Power Sources
巻: 196
号: 24
開始ページ: 10679
終了ページ: 10685
抄録: Solid electrolyte interface (SEI) films formed on Li_{1−x}CoO_2 electrodes were observed with hard X-ray photoelectron spectroscopy (HX-PES). This paper particularly focuses on film thickness estimation using HX-PES with theoretical calculation. The validity of the calculation was proven by experiments using model SEI films. The native film formed on a LiCoO2 composite electrode was estimated to be LiF with its thickness of 5 nm. Formation of Co (II) species on top of LiCoO_2 was also indicated. Storage of the electrode at 60 °C brought about considerable film growth (30–40 nm) with carbonate compounds formation. SEI film changes during charging of the LiCoO_2 electrode were also examined. The main component in the film was deduced to be LiF or a kind of fluorite, with its thickness decreased during charging. The SEI formation mechanisms are also elucidated.
著作権等: © 2011 Elsevier B.V.
This is not the published version. Please cite only the published version.
この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。
URI: http://hdl.handle.net/2433/149214
DOI(出版社版): 10.1016/j.jpowsour.2011.08.097
出現コレクション:学術雑誌掲載論文等

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