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j.jpowsour.2011.08.097.pdf | 682.36 kB | Adobe PDF | 見る/開く |
タイトル: | Thickness estimation of interface films formed on Li_{1−x}CoO2 electrodes by hard X-ray photoelectron spectroscopy |
著者: | Takanashi, Yu Orikasa, Yuki Mogi, Masato Oishi, Masatsugu Murayama, Haruno Sato, Kenji Yamashige, Hisao Takamatsu, Daiko Fujimoto, Takahiro Tanida, Hajime Arai, Hajime Ohta, Toshiaki Matsubara, Eiichiro https://orcid.org/0000-0002-4557-2665 (unconfirmed) Uchimoto, Yoshiharu https://orcid.org/0000-0002-1491-2647 (unconfirmed) Ogumi, Zempachi |
著者名の別形: | 高梨, 優 |
発行日: | Dec-2011 |
出版者: | Elsevier B.V. |
誌名: | Journal of Power Sources |
巻: | 196 |
号: | 24 |
開始ページ: | 10679 |
終了ページ: | 10685 |
抄録: | Solid electrolyte interface (SEI) films formed on Li_{1−x}CoO_2 electrodes were observed with hard X-ray photoelectron spectroscopy (HX-PES). This paper particularly focuses on film thickness estimation using HX-PES with theoretical calculation. The validity of the calculation was proven by experiments using model SEI films. The native film formed on a LiCoO2 composite electrode was estimated to be LiF with its thickness of 5 nm. Formation of Co (II) species on top of LiCoO_2 was also indicated. Storage of the electrode at 60 °C brought about considerable film growth (30–40 nm) with carbonate compounds formation. SEI film changes during charging of the LiCoO_2 electrode were also examined. The main component in the film was deduced to be LiF or a kind of fluorite, with its thickness decreased during charging. The SEI formation mechanisms are also elucidated. |
著作権等: | © 2011 Elsevier B.V. This is not the published version. Please cite only the published version. この論文は出版社版でありません。引用の際には出版社版をご確認ご利用ください。 |
URI: | http://hdl.handle.net/2433/149214 |
DOI(出版社版): | 10.1016/j.jpowsour.2011.08.097 |
出現コレクション: | 学術雑誌掲載論文等 |
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