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dc.contributor.authorFukushima, Tatsuyaen
dc.contributor.authorYamamoto, Junichien
dc.contributor.authorFukuchi, Masashien
dc.contributor.authorHirata, Shuzoen
dc.contributor.authorJung, Heo Hyoen
dc.contributor.authorHirata, Osamuen
dc.contributor.authorShibano, Yukien
dc.contributor.authorAdachi, Chihayaen
dc.contributor.authorKaji, Hironorien
dc.contributor.alternative安達, 千波矢ja
dc.contributor.alternative梶, 弘典ja
dc.date.accessioned2015-10-23T06:28:05Z-
dc.date.available2015-10-23T06:28:05Z-
dc.date.issued2015-08-
dc.identifier.issn2158-3226-
dc.identifier.urihttp://hdl.handle.net/2433/200750-
dc.description.abstractLiquid organic light-emitting diodes (liquid OLEDs) are unique devices consisting only of liquid organic semiconductors in the active layer, and the device performances have been investigated recently. However, the device degradation, especially, the origin has been unknown. In this study, we show that material degradation occurs in liquid OLEDs, whose active layer is composed of carbazole with an ethylene glycol chain. Nuclear magnetic resonance (NMR) experiments clearly exhibit that the dimerization reaction of carbazole moiety occurs in the liquid OLEDs during driving the devices. In contrast, cleavages of the ethylene glycol chain are not detected within experimental error. The dimerization reaction is considered to be related to the device degradation.en
dc.format.mimetypeapplication/pdf-
dc.language.isoeng-
dc.publisherAmerican Institute of Physicsen
dc.rights© 2015 Author(s). All article content, except where otherwise noted, is licensed under a Creative Commons Attribution 3.0 Unported License.en
dc.subjectNuclear magnetic resonanceen
dc.subjectOrganic light emitting diodesen
dc.subjectLiquid semiconductorsen
dc.subjectOrganic liquidsen
dc.subjectActive layeren
dc.titleMaterial degradation of liquid organic semiconductors analyzed by nuclear magnetic resonance spectroscopyen
dc.typejournal article-
dc.type.niitypeJournal Article-
dc.identifier.jtitleAIP Advancesen
dc.identifier.volume5-
dc.identifier.issue8-
dc.relation.doi10.1063/1.4928515-
dc.textversionpublisher-
dc.identifier.artnum087124-
dcterms.accessRightsopen access-
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