|Title:||Accurate Molecular Orientation Analysis Using Infrared pMAIRS Considering the Refractive Index of the Thin Film Sample|
|Authors:||Shioya, Nobutaka https://orcid.org/0000-0002-2915-894X (unconfirmed)|
Shimoaka, Takafumi https://orcid.org/0000-0001-9131-9831 (unconfirmed)
Hasegawa, Takeshi https://orcid.org/0000-0001-5574-9869 (unconfirmed)
|Author's alias:||長谷川, 健|
|Journal title:||Applied Spectroscopy|
|Abstract:||Infrared (IR) p-polarized multiple-angle incidence resolution spectrometry (pMAIRS) is a powerful tool for analyzing the molecular orientation in an organic thin film. In particular, pMAIRS works powerfully for a thin film with a highly rough surface irrespective of degree of the crystallinity. Recently, the optimal experimental condition has comprehensively been revealed, with which the accuracy of the analytical results has largely been improved. Regardless, some unresolved matters still remain. A structurally isotropic sample, for example, yields different peak intensities in the in-plane and out-of-plane spectra. In the present study, this effect is shown to be due to the refractive index of the sample film and a correction factor has been developed using rigorous theoretical methods. As a result, with the use of the correction factor, organic materials having atypical refractive indices such as perfluoroalkyl compounds (n = 1.35) and fullerene (n = 1.83) can be analyzed with high accuracy comparable to a compound having a normal refractive index of approximately 1.55. With this improved technique, we are also ready for discriminating an isotropic structure from an oriented sample having the magic angle of 54.7°.|
|Rights:||The final, definitive version of this paper has been published in 'Applied Spectroscopy, Volume 71, Issue 6, pp 1242-1248, June 2017' by SAGE Publications Ltd, All rights reserved. ©The Author(s)|
This is not the published version. Please cite only the published version.
|Appears in Collections:||Journal Articles|
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