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dc.contributor.authorHarada, Kenen
dc.contributor.authorNiitsu, Kodaien
dc.contributor.authorShimada, Keikoen
dc.contributor.authorKodama, Tetsujien
dc.contributor.authorAkashi, Tetsuyaen
dc.contributor.authorOno, Yoshimasa Aen
dc.contributor.authorShindo, Daisukeen
dc.contributor.authorShinada, Hiroyukien
dc.contributor.authorMori, Shigeoen
dc.contributor.alternative新津, 甲大ja
dc.date.accessioned2020-02-04T06:07:48Z-
dc.date.available2020-02-04T06:07:48Z-
dc.date.issued2019-06-
dc.identifier.issn2050-5698-
dc.identifier.urihttp://hdl.handle.net/2433/245571-
dc.description.abstractElectron holography in Fraunhofer region was realized by using an asymmetric double slit. A Fraunhofer diffraction wave from a wider slit worked as an objective wave interfered with a plane wave from a narrower slit as a reference wave under the pre-Fraunhofer condition and recorded as a hologram. Here, the pre-Fraunhofer condition means that the following conditions are simultaneously satisfied: single-slit observations are performed under the Fraunhofer condition and the double-slit observations are performed under the Fresnel condition. Amplitude and phase distributions of the Fraunhofer diffraction wave were reconstructed from the hologram by the Fourier transform reconstruction method. The reconstructed amplitude and phase images corresponded to Fraunhofer diffraction patterns; in particular, the phase steps of π at each band pattern in the phase image were confirmed. We hope that the developed Fraunhofer electron holography can be extended to a direct phase detection method in the reciprocal space.en
dc.format.mimetypeapplication/pdf-
dc.language.isoeng-
dc.publisherOxford University Press (OUP)en
dc.rights© The Author(s) 2019. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. This is an Open Access article distributed under the terms of the Creative Commons Attribution Non-Commercial License (http://creativecommons.org/licenses/by-nc/4.0/), which permits non-commercial re-use, distribution, and reproduction in any medium, provided the original work is properly cited. For commercial re-use, please contact journals.permissions@oup.comen
dc.subjectelectron holographyen
dc.subjectFraunhofer diffractionen
dc.subjectdouble sliten
dc.subjectphase distributionen
dc.subjectinterferometryen
dc.titleElectron holography on Fraunhofer diffractionen
dc.typejournal article-
dc.type.niitypeJournal Article-
dc.identifier.jtitleMicroscopyen
dc.identifier.volume68-
dc.identifier.issue3-
dc.identifier.spage254-
dc.identifier.epage260-
dc.relation.doi10.1093/jmicro/dfz007-
dc.textversionpublisher-
dc.identifier.pmid30860589-
dcterms.accessRightsopen access-
datacite.awardNumber18H03475-
dc.identifier.eissn2050-5701-
jpcoar.funderName日本学術振興会ja
jpcoar.funderName.alternativeJapan Society for the Promotion of Science (JSPS)en
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