飛躍的な発展を遂げる二次イオン質量分析（SIMS）法の展望有機・生体高分子分野への新展開

Abstract

Overview of SIMS technique is reported in conjunction with novel primary ion beams and advanced mass spectrometers. Many applications of SIMS, from organic semiconductors to cells and tissues, have been demonstrated over the past 10 years. One of the biggest problems was the “static limit” in the analysis of organic molecules, which are very fragile in ion bombardment. However, this problem was overcome after the development of large cluster ion beams. This opens up new possibilities for SIMS to analyze organic materials. Future prospects of MS/MS technique and “Ambient SIMS” with MeV ion beam are discussed.