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Title: Schottky barriers for Pt on 6H-and 4H-SiC (0001), (000(1)over-bar), (1(1)over-bar00) and (1(2)over-bar10) faces measured by I-V, C-V and internal photoemission
Authors: Shigiltchoff, O
Kimoto, T  kyouindb  KAKEN_id  orcid https://orcid.org/0000-0002-6649-2090 (unconfirmed)
Hobgood, D
Neudeck, PG
Porter, LM
Devaty, RP
Choyke, WJ
Keywords: breakdown
C-V measurements
I-V
internal photoemission
Schottky barrier
Issue Date: 2002
Publisher: TRANS TECH PUBLICATIONS LTD
Journal title: SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS
Volume: 389-3
Start page: 921
End page: 924
URI: http://hdl.handle.net/2433/8876
Link: Web of Science
Appears in Collections:Graduate School of Engineering Literature Database

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