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| Title: | Sub-mu m scale photoluminescence image of SiC and GaN at a low temperature |
| Authors: | Yoshimoto, M Goto, M Saraie, J Kimoto, T    https://orcid.org/0000-0002-6649-2090 (unconfirmed)Matsunami, H |
| Keywords: | defect donor-acceptor pairs excitonic emission impurity non-radiative recombination photoluminescence image polytypism sub-micron resolution |
| Issue Date: | 2000 |
| Publisher: | TRANS TECH PUBLICATIONS LTD |
| Journal title: | SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2 |
| Volume: | 338-3 |
| Start page: | 627 |
| End page: | 630 |
| URI: | http://hdl.handle.net/2433/8923 |
| Link: | Web of Science |
| Appears in Collections: | Graduate School of Engineering Literature Database |
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