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| 書誌情報 | ファイル |
|---|---|
| Characterization of nanotextured AIN thin films by x-ray absorption near-edge structures Suga, T; Kameyama, S; Yoshioka, S; Yamamoto, T; Tanaka, I; Mizoguchi, T (2005-04-18) APPLIED PHYSICS LETTERS, 86(16) |  |
| Characterization of nanotextured AIN thin films by x-ray absorption near-edge structures Suga, T; Kameyama, S; Yoshioka, S; Yamamoto, T; Tanaka, I; Mizoguchi, T (2005) APPLIED PHYSICS LETTERS, 86(16) | |
| Theoretical investigation of AlK-edge X-ray absorption spectra of Al, AlN and Al2O3 Mogi, M; Yamamoto, T; Mizoguchi, T; Tatsumi, K; Yoshioka, S; Kameyama, S; Tanaka, I; Adachi, H (2004) MATERIALS TRANSACTIONS, 45(7): 2031-2034 |