検索
検索条件の追加:
検索条件を追加することで検索結果を絞り込むことができます。
検索結果表示: 1-3 / 3.
- 前
- 1
- 次
検索結果:
| 書誌情報 | ファイル |
|---|---|
| Identification of chirality of enantiomorphic TaSi2 crystallites by convergent-beam electron diffraction Sakamoto, H; Fujii, A; Inui, H; Tanaka, K; Yamaguchi, M; Ishizuka, K (2003) THERMEC'2003, PTS 1-5, 426-4: 1783-1788 | |
| Defect structures in TaSi2 thin films produced by co-sputtering Inui, H; Fujii, A; Hashimoto, T; Tanaka, K; Yamaguchi, M; Ishizuka, K (2003) ACTA MATERIALIA, 51(8): 2285-2296 | |
| New electron diffraction method to identify the chirality of enantiomorphic crystals Inui, H; Fujii, A; Tanaka, K; Sakamoto, H; Ishizuka, K (2003) ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL SCIENCE, 59: 802-810 |