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| 書誌情報 | ファイル |
|---|---|
| Energetics and electronic structure of point defects associated with oxygen excess at a tilt boundary of ZnO Oba, F; Adachi, H; Tanaka, I (2000) JOURNAL OF MATERIALS RESEARCH, 15(10): 2167-2175 | |
| Chemical bondings around intercalated Cr and Fe atoms in TiS2 Kim, YS; Li, J; Tanaka, I; Koyama, Y; Adachi, H (2000) MATERIALS TRANSACTIONS JIM, 41(8): 1088-1091 | |
| Prediction of the new spinel phase of Ti3N4, and SiTi2N4 and the metal-insulator transition Ching, WY; Mo, SD; Ouyang, L; Tanaka, I; Yoshiya, M (2000-04-15) PHYSICAL REVIEW B, 61(16): 10609-10614 |  |
| Core-hole effects on theoretical electron-energy-loss near-edge structure and near edge x-ray absorption fine structure of MgO Mizoguchi, T; Tanaka, I; Yoshiya, M; Oba, F; Ogasawara, K; Adachi, H (2000-01-15) PHYSICAL REVIEW B, 61(3): 2180-2187 | |
| Calculation of multiplet structures of Cr3+ and V3+ in alpha-Al2O3 based on a hybrid method of density-functional theory and the configuration interaction Ogasawara, K; Ishii, T; Tanaka, I; Adachi, H (2000-01-01) PHYSICAL REVIEW B, 61(1): 143-161 | |
| Mechanism of electrical conductivity of transparent InGaZnO4 Orita, M; Tanji, H; Mizuno, M; Adachi, H; Tanaka, I (2000-01-15) PHYSICAL REVIEW B, 61(3): 1811-1816 | |
| Core-hole effects on theoretical electron-energy-loss near-edge structure and near edge x-ray absorption fine structure of MgO Mizoguchi, T; Tanaka, I; Yoshiya, M; Oba, F; Ogasawara, K; Adachi, H (2000) PHYSICAL REVIEW B, 61(3): 2180-2187 | |
| Geometry and electronic structure of [0001]/((1)over-bar(2)over-bar30) Sigma=7 symmetric tilt boundary in ZnO Oba, F; Tanaka, I; Nishitani, SR; Adachi, H; Slater, B; Gay, DH (2000) PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 80(7): 1567-1581 | |
| Electronic structure of silica glass under strong electric field Makino, Y; Tanaka, I; Kawamura, K; Adachi, H; Hirao, K (2000) PROGRESS OF THEORETICAL PHYSICS SUPPLEMENT, 138: 239-240 | |
| Energetical role of modeled intergranular glassy film in Si3N4-SiO2 ceramics Yoshiya, M; Tanaka, I; Adachi, H (2000) ACTA MATERIALIA, 48(18-19): 4641-4645 |