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書誌情報	ファイル
Core-hole effect on dipolar and quadrupolar transitions of SrTiO3 and BaTiO3 at TiK edge Yamamoto, T; Mizoguchi, T; Tanaka, I (2005-06) PHYSICAL REVIEW B, 71(24)
Coordination and interface analysis of atomic-layer-deposition Al2O3 on Si(001) using energy-loss near-edge structures Kimoto, K; Matsui, Y; Nabatame, T; Yasuda, T; Mizoguchi, T; Tanaka, I; Toriumi, A (2003-11-24) APPLIED PHYSICS LETTERS, 83(21): 4306-4308
Electron energy loss near-edge structures of cubic Si3N4 Tanaka, I; Mizoguchi, T; Sekine, T; He, H; Kimoto, K; Kobayashi, T; Mo, SD; Ching, WY (2001-04-09) APPLIED PHYSICS LETTERS, 78(15): 2134-2136
All-electron Bethe-Salpeter calculations for shallow-core x-ray absorption near-edge structures Olovsson, W; Tanaka, I; Mizoguchi, T; Puschnig, P; Ambrosch-Draxl, C (2009) PHYSICAL REVIEW B, 79(4)
First-principles multielectron calculations of Ni L-2,L-3 NEXAFS and ELNES for LiNiO2 and related compounds Ikeno, H; Tanaka, I; Koyama, Y; Mizoguchi, T; Ogasawara, K (2005) PHYSICAL REVIEW B, 72(7)
First principles study of core-hole effect on fluorine K-edge X-ray absorption spectra of MgF2 and ZnF2 Yamamoto, T; Mizoguchi, T; Tatsumi, K; Tanaka, I; Adachi, H; Muramatsu, Y; Gullikson, EM; Perera, RCC (2004) MATERIALS TRANSACTIONS, 45(7): 1991-1993
XANES and ELNES in ceramic science Tanaka, I; Mizoguchi, T; Yamamoto, T (2005) JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 88(8): 2013-2029
Defect and electronic structures in TiSi2 thin films produced by co-sputtering part 1: Defect analysis by transmission electron microscopy Inui, H; Hashimoto, T; Tanaka, K; Tanaka, I; Mizoguchi, T; Adachi, H; Yamaguchi, M (2001) ACTA MATERIALIA, 49(1): 83-92
All-electron Bethe-Salpeter calculations for shallow-core x-ray absorption near-edge structures Olovsson, W; Tanaka, I; Mizoguchi, T; Puschnig, P; Ambrosch-Draxl, C (2009-01) PHYSICAL REVIEW B, 79(4)
Characterization of nanotextured AIN thin films by x-ray absorption near-edge structures Suga, T; Kameyama, S; Yoshioka, S; Yamamoto, T; Tanaka, I; Mizoguchi, T (2005-04-18) APPLIED PHYSICS LETTERS, 86(16)