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| 書誌情報 | ファイル |
|---|---|
| Electron energy loss near-edge structures of cubic Si3N4 Tanaka, I; Mizoguchi, T; Sekine, T; He, H; Kimoto, K; Kobayashi, T; Mo, SD; Ching, WY (2001-04-09) APPLIED PHYSICS LETTERS, 78(15): 2134-2136 |  |
| Defect and electronic structures in TiSi2 thin films produced by co-sputtering part 1: Defect analysis by transmission electron microscopy Inui, H; Hashimoto, T; Tanaka, K; Tanaka, I; Mizoguchi, T; Adachi, H; Yamaguchi, M (2001) ACTA MATERIALIA, 49(1): 83-92 | |
| Electron-energy-loss near edge structures of six-fold-coordinated Zn in MgO Mizoguchi, T; Yoshiya, M; Li, J; Oba, F; Tanaka, I; Adachi, H (2001) ULTRAMICROSCOPY, 86(3-4): 363-370 | |
| Defect and electronic structure of TiSi2 thin films produced by co-sputterings. Part II: Chemical bonding and electron energy-loss near-edge structures Mizoguchi, T; Tanaka, I; Mizuno, M; Adachi, H; Hashimoto, T; Inui, H; Yamaguchi, M (2001) ACTA MATERIALIA, 49(12): 2321-2328 | |
| Electron energy loss near-edge structures of cubic Si3N4 Tanaka, I; Mizoguchi, T; Sekine, T; He, H; Kimoto, K; Kobayashi, T; Mo, SD; Ching, WY (2001) APPLIED PHYSICS LETTERS, 78(15): 2134-2136 |