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| 書誌情報 | ファイル |
|---|---|
| 直鎖炭化水素イオンビームによるシリコン表面照射効果の分子量依存性 今中, 浩輔; 竹内, 光明; 龍頭, 啓充; 高岡, 義寛 (2012-11) 電子情報通信学会技術研究報告. SDM, シリコン材料・デバイス, 112(337): 31-35 |  |
| Characterization of Plasma Process-Induced Latent Defects in Surface and Interface Layer of Si Substrate Nakakubo, Yoshinori; Eriguchi, Koji; Ono, Kouichi (2015-02-14) ECS Journal of Solid State Science and Technology, 4(6): N5077-N5083 | |
| Bandgap shift by quantum confinement effect in <100> Si-nanowires derived from threshold-voltage shift of fabricated metal-oxide-semiconductor field effect transistors and theoretical calculations Yoshioka, Hironori; Morioka, Naoya; Suda, Jun; Kimoto, Tsunenobu (2011-03-15) JOURNAL OF APPLIED PHYSICS, 109(6) | |
| Partially disordered photonic-crystal thin films for enhanced and robust photovoltaics Oskooi, Ardavan; Favuzzi, Pedro A.; Tanaka, Yoshinori; Shigeta, Hiroaki; Kawakami, Yoichi; Noda, Susumu (2012-03) APPLIED PHYSICS LETTERS, 100(18) | |
| Controlling Localization and Excretion of Nanoparticles by Click Modification of the Surface Chemical Structures inside Living Cells Ito, Takeo; Nakamura, Takuma; Kusaka, Eriko; Kurihara, Ryohsuke; Tanabe, Kazuhito (2015-03-17) ChemPlusChem, 80(5): 796-799 | |
| Luminescence of black silicon fabricated by high-repetition rate femtosecond laser pulses Chen, Tao; Si, Jinhai; Hou, Xun; Kanehira, Shingo; Miura, Kiyotaka; Hirao, Kazuyuki (2011-10-01) JOURNAL OF APPLIED PHYSICS, 110(7) | |
| Quantum-confinement effect on holes in silicon nanowires: Relationship between wave function and band structure Morioka, Naoya; Yoshioka, Hironori; Suda, Jun; Kimoto, Tsunenobu (2011-03) Journal of Applied Physics, 109(6) | |
| Reduction in surface recombination and enhancement of light emission in silicon photonic crystals treated by high-pressure water-vapor annealing Fujita, Masayuki; Gelloz, Bernard; Koshida, Nobuyoshi; Noda, Susumu (2010-09-20) Applied Physics Letters, 97(12) | |
| Influence of uniaxial mechanical stress on the high frequency performance of metal-oxide-semiconductor field effect transistors on (100) Si wafer Han, Younggun; Koganemaru, Masaaki; Ikeda, Toru; Miyazaki, Noriyuki; Choi, Woon; Tomokage, Hajime (2010) APPLIED PHYSICS LETTERS, 96(21) | |
| Evaluation of Stress Effects on Electrical Characteristics of N-Type MOSFETs: Variations of DC Characteristics During the Resin-Molding Process Koganemaru, Masaaki; Ikeda, Toru; Miyazaki, Noriyuki; Tomokage, Hajime (2010) JOURNAL OF ELECTRONIC PACKAGING, 132(1) |