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書誌情報 | ファイル |
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Defect and electronic structures in TiSi2 thin films produced by co-sputtering part 1: Defect analysis by transmission electron microscopy Inui, H; Hashimoto, T; Tanaka, K; Tanaka, I; Mizoguchi, T; Adachi, H; Yamaguchi, M (2001) ACTA MATERIALIA, 49(1): 83-92 | |
Defect and electronic structure of TiSi2 thin films produced by co-sputterings. Part II: Chemical bonding and electron energy-loss near-edge structures Mizoguchi, T; Tanaka, I; Mizuno, M; Adachi, H; Hashimoto, T; Inui, H; Yamaguchi, M (2001) ACTA MATERIALIA, 49(12): 2321-2328 |