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Reduction of the C49 -> C54 phase transformation temperature in co-sputtered TiSi2 thin films by ternary alloying Hashimoto, T; Inui, H; Tanaka, K; Yamaguchi, M (2003) INTERMETALLICS, 11(5): 417-424 | |
Temperature dependence of thermal expansion and elastic constants of single crystals of ZrB2 and the suitability of ZrB2 as a substrate for GaN film Okamoto, NL; Kusakari, M; Tanaka, K; Inui, H; Yamaguchi, M; Otani, S (2003) JOURNAL OF APPLIED PHYSICS, 93(1): 88-93 | |
Defect structures in cosputtered thin films of transition-metal disilicides with C11(b), C40 and C54 structures Inui, H; Hashimoto, T; Fujii, A; Sakamoto, H; Okamoto, NL; Tanaka, K; Yamaguchi, M (2004) METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 35A(8): 2229-2238 | |
{101}< 101 > twins in Mo-doped TiSi2 thin films with the C54 structure Inui, H; Okamoto, NL; Hashimoto, T; Tanaka, K; Yamaguchi, M (2003) PHILOSOPHICAL MAGAZINE, 83(12): 1463-1478 | |
Atomic structures and energetics of LaNi5-H solid solution and hydrides Tatsumi, K; Tanaka, I; Inui, H; Tanaka, K; Yamaguchi, M; Adachi, H (2001) PHYSICAL REVIEW B, 6418(18) | |
Evaluation of elastic strain energy associated with the formation of hydride precipitates in LaNi5 Tanaka, K; Okazaki, S; Ichitsubo, T; Yamamoto, T; Inui, H; Yamaguchi, M; Koiwa, M (2000) INTERMETALLICS, 8(5-6): 613-618 | |
Defect structures in TaSi2 thin films produced by co-sputtering Inui, H; Fujii, A; Hashimoto, T; Tanaka, K; Yamaguchi, M; Ishizuka, K (2003) ACTA MATERIALIA, 51(8): 2285-2296 | |
Crystal structure refinement of a type-I clathrate compound Ba8Ge43 with an ordered arrangement of germanium vacancies Okamoto, NL; Tanaka, K; Inui, H (2006) ACTA MATERIALIA, 54(1): 173-178 | |
Crystal structure and thermoelectric properties of type-I clathrate compounds in the Ba-Ga-Ge system Okamoto, NL; Kishida, K; Tanaka, K; Inui, H (2006) JOURNAL OF APPLIED PHYSICS, 100(7) | |
Splitting of guest atom sites and lattice thermal conductivity of type-I and type-III clathrate compounds in the Ba-Ga-Ge system Okamoto, NL; Kim, JH; Tanaka, K; Inui, H (2006) ACTA MATERIALIA, 54(20): 5519-5528 |
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