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| 書誌情報 | ファイル |
|---|---|
| Defect and electronic structures in TiSi2 thin films produced by co-sputtering part 1: Defect analysis by transmission electron microscopy Inui, H; Hashimoto, T; Tanaka, K; Tanaka, I; Mizoguchi, T; Adachi, H; Yamaguchi, M (2001) ACTA MATERIALIA, 49(1): 83-92 | |
| Defect structures in TaSi2 thin films produced by co-sputtering Inui, H; Fujii, A; Hashimoto, T; Tanaka, K; Yamaguchi, M; Ishizuka, K (2003) ACTA MATERIALIA, 51(8): 2285-2296 |