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| 書誌情報 | ファイル |
|---|---|
| Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment Rode, S.; Stark, R.; Luebbe, J.; Troeger, L.; Schuette, J.; Umeda, K.; Kobayashi, K.; Yamada, H.; Kuehnle, A. (2011-07) REVIEW OF SCIENTIFIC INSTRUMENTS, 82(7) |  |
| Frequency noise in frequency modulation atomic force microscopy Kobayashi, Kei; Yamada, Hirofumi; Matsushige, Kazumi (2009) REVIEW OF SCIENTIFIC INSTRUMENTS, 80(4) | |
| A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy Hosokawa, Yoshihiro; Kobayashi, Kei; Oyabu, Noriaki; Matsushige, Kazumi; Yamada, Hirofumi (2010) REVIEW OF SCIENTIFIC INSTRUMENTS, 81(9) | |
| Reduction of frequency noise and frequency shift by phase shifting elements in frequency modulation atomic force microscopy. Kobayashi, Kei; Yamada, Hirofumi; Matsushige, Kazumi (2011-03) The Review of scientific instruments, 82(3) | |
| A procedure to determine the optimum imaging parameters for atomic/molecular resolution frequency modulation atomic force microscopy Hosokawa, Yoshihiro; Kobayashi, Kei; Oyabu, Noriaki; Matsushige, Kazumi; Yamada, Hirofumi (2010-09) REVIEW OF SCIENTIFIC INSTRUMENTS, 81(9) | |