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| 書誌情報 | ファイル |
|---|---|
| Defect and electronic structures in TiSi2 thin films produced by co-sputtering part 1: Defect analysis by transmission electron microscopy Inui, H; Hashimoto, T; Tanaka, K; Tanaka, I; Mizoguchi, T; Adachi, H; Yamaguchi, M (2001) ACTA MATERIALIA, 49(1): 83-92 | |
| Reduction of the C49 -> C54 phase transformation temperature in co-sputtered TiSi2 thin films by ternary alloying Hashimoto, T; Inui, H; Tanaka, K; Yamaguchi, M (2003) INTERMETALLICS, 11(5): 417-424 | |
| Defect structures in cosputtered thin films of transition-metal disilicides with C11(b), C40 and C54 structures Inui, H; Hashimoto, T; Fujii, A; Sakamoto, H; Okamoto, NL; Tanaka, K; Yamaguchi, M (2004) METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 35A(8): 2229-2238 | |
| {101}< 101 > twins in Mo-doped TiSi2 thin films with the C54 structure Inui, H; Okamoto, NL; Hashimoto, T; Tanaka, K; Yamaguchi, M (2003) PHILOSOPHICAL MAGAZINE, 83(12): 1463-1478 | |
| Defect structures in TaSi2 thin films produced by co-sputtering Inui, H; Fujii, A; Hashimoto, T; Tanaka, K; Yamaguchi, M; Ishizuka, K (2003) ACTA MATERIALIA, 51(8): 2285-2296 |