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書誌情報ファイル
Interface properties in metal-oxide-semiconductor structures on n-type 4H-SiC(03(3)over-bar8)
  Yano, H; Hirao, T; Kimoto, T; Matsunami, H; Shiomi, H (2002-12-16)
  Applied Physics Letters, 81(25): 4772-4774
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Interface properties in metal-oxide-semiconductor structures on n-type 4H-SiC(03(3)over-bar8)
  Yano, H; Hirao, T; Kimoto, T; Matsunami, H; Shiomi, H (2002)
  APPLIED PHYSICS LETTERS, 81(25): 4772-4774
Homoepitaxial growth of 4H-SiC(0 3 (3)over-bar-8) and nitrogen doping by chemical vapor deposition
  Kimoto, T; Hirao, T; Nakazawa, S; Shiomi, H; Matsunami, H (2003)
  JOURNAL OF CRYSTAL GROWTH, 249(1-2): 208-215