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| 書誌情報 | ファイル |
|---|---|
| Nonradiative recombination at threading dislocations in 4H-SiC epilayers studied by micro-photoluminescence mapping Feng, Gan; Suda, Jun; Kimoto, Tsunenobu (2011-08-01) JOURNAL OF APPLIED PHYSICS, 110(3) |  |
| Triple Shockley type stacking faults in 4H-SiC epilayers Feng, Gan; Suda, Jun; Kimoto, Tsunenobu (2009-03) APPLIED PHYSICS LETTERS, 94(9) | |
| Triple Shockley type stacking faults in 4H-SiC epilayers Feng, Gan; Suda, Jun; Kimoto, Tsunenobu (2009) APPLIED PHYSICS LETTERS, 94(9) |