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書誌情報ファイル
Fast growth and doping characteristics of alpha-SiC in horizontal cold-wall chemical vapor deposition
  Nakamura, S; Kimoto, T; Matsunami, H (2002)
  SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS, 389-3: 183-186
Fast epitaxial growth of thick 4H-SiC with specular surface by chimney-type vertical hot-wall chemical vapor deposition
  Fujiwara, H; Danno, K; Kimoto, T; Tojo, T; Matsunami, H (2004)
  SILICON CARBIDE AND RELATED MATERIALS 2003, PTS 1 AND 2, 457-460: 205-208
Spectra associated with stacking faults in 4H-SiC grown in a hot-wall CVD reactor
  Bai, S; Wagner, G; Shishkin, E; Choyke, WJ; Devaty, RP; Zhang, M; Pirouz, P; Kimoto, T (2002)
  SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS, 389-3: 589-592
High-purity and thick 4H-and 6H-SiC(0001) epitaxial growth by cold-wall chemical vapor deposition and high-voltage pin diodes
  Tamura, S; Fujihira, K; Kimoto, T; Matsunami, H (2001)
  JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 40(4A): L319-L322
Fast epitaxial growth of 4H-SiC by chimney-type hot-wall CVD
  Fujihira, K; Kimoto, T; Matsunami, H (2002)
  SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS, 389-3: 175-178
Reduction of stacking faults in fast epitaxial growth of 4H-SiC and its impacts on high-voltage Schottky diodes
  Fujiwara, H; Kimoto, T; Tojo, T; Matsunami, H (2005)
  SILICON CARBIDE AND RELATED MATERIALS 2004, 483: 151-154
Fast epitaxial growth of high-quality 4H-SiC by vertical hot-wall CVD
  Fujihira, K; Kimoto, T; Matsunami, H (2002)
  SILICON CARBIDE AND RELATED MATERIALS - 2002, 433-4: 161-164